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| Wafer incoming materials | Macro inspection Microscopic examination Test yield target control |
PCS 5ea/PCS 300ea/PCS, yield of 95.67%/as per customer requirements |
| Packaging process | Bull; Macro inspection Microscopic examination SPC& Cpk control |
PCS 5ea/PCS Knife marks within the control line, CPK≥ 1.67 |
| FT testing | Test yield target control QA electrical AQL sampling Peeling force test |
Electrical yield>92.7%, O/S defect<0.5% AQL0.065 35-85g |
| FVI OQC | Visual inspection Shipment inspection |
Visual inspection FVI, OQC AQL0.065 |
